P6251高压差分探头
- ModelP6251
- Attributes高压差分探头
- Category TEKTRONIX 泰克 > 差分探头
- BrandTEKTRONIX 泰克
- Description关键性能规格:1 GHz和500 MHz的探头带宽,小于1 pF的差分输入电容,1 MΩ的差分输入电阻,±42 v(直流+峰值交流)的差分输入电压,大于18 dB的共模抑制比(在250 MHz 50倍衰减时)。
Detailed Introduction Technical Documents
The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today's Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.
Key performance specifications
1 GHz and 500 MHz probe bandwidth
<1 pF differential input capacitance
1 MΩ differential input resistance
±42 v (DC + pk AC) differential input voltage
>18 dB CMRR (at 250 MHz 50X attenuation)
Key features
Outstanding electrical performance
Selectable bandwidth-limiting filters
DC reject
Versatile DUT connectivity
Small compact probe head for probing small geometry circuit elements
Straight pin, square pin, solder down, variable pitch standard accessories
Robust design for reliability
Easy to use
Connect directly to the TekProbe™ interface oscilloscopes, or to TekConnect® oscilloscopes using TCA-BNC adapter
Connect directly to oscilloscopes with the TekVPI™ probe interface
Easy access to scope-displayed probe menu for probe setup control and operating status information
Remote GPIB/USB probe control through the oscilloscope
AutoZero – zeros out output offset
Provides automatic units scaling and readout on the oscilloscope display
TDP1000, TDP0500
P6251
Applications
High-speed switch mode power supply design
CAN/LIN bus design
Digital design and characterization
Manufacturing engineering test
Research and development
High-voltage differential probes
The TDP1000, TDP0500, and P6251 High-voltage Differential Probes are specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. These probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:
Outstanding Electrical Performance
Versatile Device-Under-Test Connectivity
Ease of Use
